Cerebras Systems develops wafer scale engine chip with 1.2 trillion transistors

Published: September 18, 2019

Cerebras Systems, Los Altos, Calif., a startup dedicated to accelerating artificial intelligence computing, announces that it has developed the largest chip ever built: a WSE chip with 71.6 square inches of area.

News, Magazine & Media / Industry News

Binghamton University to acquire $1.75M HAXPES x-ray system for materials research

Published: September 12, 2019

Binghamton University, New York, announces that the school will acquire a HArd x-ray Photoelectron Spectroscopy system (or HAXPES), which allows researchers to get detailed information about a device or material without taking it apart.

News, Magazine & Media / Industry News

Zeiss ion beam microscopes feature advances in analytics, tomography, data integrity

Published: September 12, 2019

Zeiss, Germany, announces that its ion beam microscopes now have new capabilities that cover advancements in analytics, tomography, sample preparation, and data integrity.

News, Magazine & Media / Industry News

Oxford Instruments Ergo software for AFM includes smart algorithms for optimal settings

Published: September 11, 2019

Oxford Instruments, Concord, Mass., announces the launch of the new Ergo software platform for its Asylum Research atomic force microscopes.

News, Magazine & Media / Industry News

Picosun plasma-enhanced ALD coating process replaces ions with low-energy radicals

Published: September 02, 2019

Picosun Group, Finland, reports excellent results obtained with its next generation PEALD (plasma-enhanced ALD) technology, which enables deposition at low temperatures and of several materials that could not be deposited with thermal processes only.

News, Magazine & Media / Industry News

Shimadzu Vickers micro-hardness testers feature high data reliability and expandability

Published: August 19, 2019

Shimadzu, Japan, has released the HMV-G30 / HMV-G31 series Vickers micro hardness testers, which are equipped with new functions to improve data reliability, to accommodate ISO standards, and to provide high expandability.

News, Magazine & Media / Industry News

Bruker Hysitron TS 77 test system designed to measure nanometers to micrometers

Published: August 19, 2019

Bruker, Billerica, Mass., introduces the Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system, which is built around Bruker’s TriboScope capacitive transducer technology.

News, Magazine & Media / Industry News

Scanning acoustic microscopy plus ToF-SIMS/AFM enables wafer-level failure analysis

Published: August 19, 2019

Researchers from Imec, Belgium, and the Fraunhofer Institute for Microstructure of Materials and Systems, Germany, will present “GHz-Scanning Acoustic Microscopy Combined with ToF-SIMS/AFM for Wafer-Level Failure Analysis of Bonding Interfaces,” at the 2019 ISTFA Conference in November.

News, Magazine & Media / Industry News

Tescan Clara ultrahigh-resolution SEM achieves excellent resolution at low beam energies

Published: August 18, 2019

Tescan, Czech Republic, introduces the Tescan Clara ultra-high-resolution scanning electron microscope (UHR-SEM), based on Tescan’s BrightBeam technology, which enables variable, filtered BSE detection.

News, Magazine & Media / Industry News

Toppan Photomasks to supply GlobalFoundries with photomasks and related services

Published: August 15, 2019

Toppan Photomasks Inc., Round Rock, Texas, and GlobalFoundries, Santa Clara, Calif., announce that they have entered into a multi-year supply agreement in which Toppan will provide GF with photomasks and related services currently supported by GF’s photomask manufacturing operation in Burlington, Vermont.

News, Magazine & Media / Industry News