Bruker Skyscan X-ray nano-CT offers ultrahigh resolution for larger fields of view

Published: June 13, 2018

Bruker, Billerica, Mass., has launched the Skyscan 2214, a multiscale X-ray nano-computed-tomography system with a unique X-ray source and detector geometry that generates sharper images with excellent precision.

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Dr. Patrice Turchi Selected as the 2019 Recipient of the J. Willard Gibbs Phase Equilibria Award

Published: June 07, 2018

ASM is pleased to announce that Dr. Patrice Turchi, Senior Scientist, Lawrence Livermore National Laboratory, Livermore, CA, is the 2019 J. Willard Gibbs Phase Equilibria Award recipient. His citation reads: “For outstanding and pioneering contributions in the application of first-principles, quantum-mechanical calculations to the modeling of phase equilibria and thermodynamic behavior of alloys.” The Gibbs Award... View Article

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Thermo Scientific’s Prisma E SEM features high-res imaging system based on tetrode gun

Published: May 31, 2018

Thermo Scientific, Hillsboro, Ore., introduces its Prisma E scanning electron microscope, which combines a wide array of imaging and analytical modalities with advanced automation for industrial R&D, quality control, and failure analysis.

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Semi-Continuous Case Hardening by Low Pressure Carburizing and High Pressure Gas Quench

Published: May 28, 2018

In this presentation, Tom Hart of Seco Vacuum Technologies, Meadville, Pa., reports on the latest developments in semi-continuous case hardening.

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Thermo Scientific Apreo SEM for materials science features compound lens design

Published: May 24, 2018

Thermo Scientific, Hillsboro, Oregon, has developed the Apreo scanning electron microscope, which features a revolutionary compound lens design that combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection.

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Zeiss Zen Connect software for microscopes enables imaging all dimensions of a sample

Published: May 24, 2018

Carl Zeiss, Germany, introduces Zen Connect, new software modules with enhanced imaging technology that is especially useful for structural analysis.

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Oxford Instruments’ Layerprobe software tool designed for thin film analysis

Published: May 22, 2018

Oxford Instruments, U.K., offers LayerProbe, a software tool for thin film analysis in the SEM that is said to be faster and more cost-effective, with higher resolution than dedicated thin film measurement tools.

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Semtech acquires IC Interconnect to strengthen R&D for next-gen protection platforms

Published: May 21, 2018

Semtech Corp., Camarillo, Calif., has acquired substantially all the assets of IC Interconnect Inc., Colorado Springs, Colo., which provides contract wafer bumping and related services to the electronics industry.

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Adesto Tech acquires S3 Semiconductors to expand its portfolio of technologies

Published: May 21, 2018

Adesto Technologies, Santa Clara, Calif., a provider of innovative application-specific semiconductors for the IoT era, announces that it has acquired Dublin-based S3 Semiconductors, a global supplier of mixed-signal and RF application specific integrated circuits (ASIC) and an extensive library of design IP.

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Global semiconductor sales up 20% year-over-year in first quarter of 2018

Published: May 21, 2018

The Semiconductor Industry Association, Washington, announces that worldwide sales of semiconductors reached $111.1 billion during the first quarter of 2018, an increase of 20 percent compared to the first quarter of 2017, but 2.5 percent less than the fourth quarter of 2017.

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