WIN Semiconductors completes expansion, increases GaAs wafer capacity by 20%

Published: May 21, 2017

WIN Semiconductors Corp., Taiwan, has completed Phase 2 expansion at its newest wafer fab, Fab C, increasing manufacturing capacity by 20%.

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Rogers to exhibit high-performance circuit materials at microwave symposium

Published: May 21, 2017

Rogers Corp., Chandler, Ariz., will highlight its wide range of circuit materials at the 2017 IEEE International Microwave Symposium in June.

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CMOS-based electron backscatter diffraction detector acquires 3000 patterns/second

Published: May 21, 2017

Oxford Instruments Nanoanalysis, England, has launched Symmetry, which is said to have acquisition speed in excess of 3000 indexed patterns per second.

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Kyocera certified to supply ceramic semiconductor packaging for space vehicles

Published: May 21, 2017

Kyocera International Inc., San Diego, announces that it has received Class Y certification for its semiconductor assembly operations.

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Two-sensor-tool imaging technology detects dead open faults with high accuracy

Published: May 21, 2017

Neocera, Beltsville, Md., has developed the Magma electronic fault isolation HiRes microscope system that combines two sensors into one tool: a SQUID sensor for detecting the smallest possible currents, and a magnetoresistive sensor for best spatial resolution when scanning close to the current.

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Oxford Instruments to sell Industrial Analysis business to Hitachi High-Technologies

Published: May 14, 2017

Oxford Instruments plc, England, announces that it has agreed to sell its Industrial Analysis business to Hitachi High-Technologies Corp. for a consideration of $100 million on a cash and debt-free basis.

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Hitachi ion-milling system capable of high-speed and wide-area material processing

Published: May 14, 2017

Hitachi High-Technologies Corp., Tokyo, announces the Hitachi ArBlade 5000 broad ion-milling system, which enables high throughput and prepares wide-area cross-sectional samples.

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Lasertec hybrid confocal microscope combines laser and white light sources

Published: May 14, 2017

Lasertec, Japan, introduces the Optelics Hybrid confocal microscope, in which laser and white light sources are combined in one body, for a multi-functional high-performance confocal microscope.

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JEOL scanning electron microscope features ultrahigh resolution images of large samples

Published: May 14, 2017

JEOL USA, Peabody, Mass., introduces a new scanning electron microscope that combines the performance of a field emission SEM with the simplicity of the JEOL InTouchScope SEM series.

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Germanium oxide dissolves on liquid metal films to make crystalline semiconductors

Published: May 13, 2017

The University of Michigan, Ann Arbor, reports that its chemists have invented a method to simultaneously synthesize and deposit germanium crystalline semiconductor films from water at room temperature using equipment that can be assembled for just a few dollars.

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