EDFA Magazine
Volume 27, Issue 1, February 2025
The February 2025 issue of Electronic Device Failure Analysis includes: Backside Delayering of 10 nm Node ICs; Low Frequency Noise Spectroscopy; Quantum Diamond Microscopy for Failure Analysis; and Highlights from ISTFA 2024.
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Recent past editions
Volume 28, Issue 3, August 2026
Magazine (Global)
Volume 28, Issue 2, May 2026
Magazine (Global)
Volume 28, Issue 1, February 2026
Magazine (Global)
Volume 27, Issue 4, November 2025
Magazine (Global)