EDFA Magazine
Volume 28, Issue 1, February 2026
The February 2026 issue of Electronic Device Failure Analysis includes: A Step Toward Automation in Failure Analysis; Advanced FA using In-Situ AFM in FIB-SEM; Enhancing Soft Defect Localization; and Highlights from ISTFA 2025.
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Recent past editions
Volume 28, Issue 3, August 2026
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Volume 28, Issue 2, May 2026
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Volume 27, Issue 4, November 2025
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Volume 27, Issue 3, August 2025
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