Oxford Instruments Asylum Research, Goleta, Calif., announces the new MFP-3D Infinity Atomic Force Microscope (AFM). It has reduced the XY sensor noise by 70% and slashed the Z sensor noise by more than 85%. It provides new nanomechanical measurement capabilities, and features that make it simple to get started with tapping mode imaging.
Whether you are doing routine imaging tasks or ambitious research projects, the MFP-3D Infinity is ideal for an endless variety of applications with unlimited potential for your research.
“The MFP-3D Infinity has evolved extensively from the original MFP-3D that pioneered closed loop scanning and low noise AFM measurements,” commented Dan Bocek, Project Manager. “The development team used their superior knowledge of AFM physics and technology to accomplish truly remarkable performance improvements. Overall system height noise is now only 20pm, a third of what it was on the original MFP-3D. The practical benefit is that our customers can now achieve higher resolution while still enjoying the unmatched versatility of the MFP-3D family. No other AFM beats this combination of performance and flexibility.”
