Cameca, Paris, announces the release of the LEAP 5000, its latest-generation atom probe microscope, which offers unparalleled three-dimensional nanoscale surface, bulk, and interfacial materials analysis with atom-by-atom identification and accurate spatial positioning. The LEAP 5000 platform collects nanoscale information from a microscale dataset in just a few hours. It enables enhanced multi-hit detection capabilities for the most accurate compositional measurements.
“This highly sophisticated materials analysis instrument integrates mature technologies from previous LEAP models and comes equipped with a redesigned detection system offering increased efficiency, advanced laser control, faster data collection and real-time monitoring capabilities, all housed in a more robust and ergonomic platform,” notes Dr. Tom Kelly, Vice President for Innovation and New Technologies, and inventor of the Local Electrode Atom Probe (LEAP) technique.
Atom Probe Tomography (APT or 3D APT) is the only materials analysis technique offering extensive capability for both 3D imaging and chemical composition measurements at the atomic scale. Since its development in the 1960s, the technique has contributed to major advances in materials science.
Exclusively developed and manufactured by Cameca, LEAP microscopes are used by the most prestigious research and development laboratories around the world, including seven of the ten largest computer chip manufacturers.
