Jeol USA, Peabody, Mass., announces that the launch of its new field emission scanning electron microscope during the summer of 2020 includes virtual demonstrations of its powerful performance directly to those in the market for an analytical ultrahigh resolution SEM.
The JSM-IT800 is the company’s top-of-the-line microscope with ultrahigh spatial resolution imaging and analysis at the nanoscale. Capabilities include up to 2,000,000X magnification and an accelerating voltage range of 0.01 to 30kV, making it possible to acquire extreme details of nanostructures as well as comprehensive analysis of materials and biological specimens.
The new Jeol IT800 series of Schottky Field Emission SEMs features embedded energy dispersive X-ray (EDS) with a hybrid objective lens that combines electromagnetic and electrostatic lenses with a through-the-lens electron detection system. It is ideal for imaging magnetic materials and analyzing samples with EBSD.
The IT800 series features the latest level of analytical intelligence. It is designed to streamline operation and workflow efficiency with elegant functionality, ultrahigh resolution, and powerful software, enabling seamless acquisition of data from observation to elemental analysis and subsequent reporting.
“This new FE SEM with super hybrid lens is based on JEOL’s powerful SEM platform with NeoEngine auto functionality, seamless navigation known as ZeroMag, and live EDS analysis, making it effortless to acquire stunning images and details,” says product manager Dr. Natasha Erdman. “We are demonstrating the SEM remotely now, and will be highlighting its enhanced capabilities during our virtual M&M booth in August.” JEOL typically introduces new SEM and TEM technology at the M&M show, now being held virtually August 4-6.
