GE Aerospace, Evendale, OH, announced a $225 million investment to modernize the GE Aerospace Research Center in Niskayuna, NY, advancing the site’s legacy as the innovation engine behind breakthroughs in aviation advancements.
Continue readingScientists are building a microscope powered by a quantum computer
Researchers at four Austrian universities, TU Wien, University of Vienna, JKU Linz, and the University of Innsbruck, have developed a new approach connecting an electron microscope to a quantum computer to process quantum information carried by electrons.
Continue readingA 0.42-nanometer breakthrough could push transistors beyond silicon
A working transistor requires an extremely thin insulating layer known as the gate dielectric. This layer sits above the semiconductor and helps control the movement of electrons. As transistors shrink, making this insulating layer thinner can improve electrical control. The difficulty is that adding such layers to atomically thin semiconductors can disturb the delicate interface between the materials. That disruption can scatter electrons and erase some of the performance gains engineers are trying to achieve.
For years, researchers have therefore faced a difficult tradeoff. They could strengthen control over the transistor gate, or they could protect the mobility of the charge carriers moving through the device. Achieving both at once has been much harder.
Researchers at National Yang Ming Chiao Tung University (NYCU), Taiwan, working with TSMC Corporate Research, Taiwan, have now demonstrated a new way to address this problem by focusing on the interface itself.
The work, published in Nature Electronics, shows that carefully controlling the atomic boundary between a semiconductor and its insulating layer can allow the dielectric to be made extremely thin while maintaining strong electrical performance. Rather than searching for a completely different semiconductor, the researchers concentrated on the narrow region where the two materials meet, an area only a few atoms thick.
Instead of changing either the semiconductor or the gate dielectric, the NYCU researchers redesigned the interface connecting them.
The team first placed an ultrathin epitaxial aluminum layer directly onto monolayer molybdenum disulfide (MoS2). They then carefully oxidized the aluminum, producing an aluminum oxide layer about 0.42 nanometers thick. After that, they added the high κ hafnium oxide gate dielectric.
Despite being only a fraction of a nanometer thick, the engineered interface performs two important jobs.
First, it creates a smooth and continuous surface that allows the hafnium oxide to grow more uniformly over the MoS2. Second, it works as an atomic buffer that limits unwanted electrical interactions between the dielectric and the semiconductor. This protection helps electrons continue moving efficiently through the transistor channel.
In this design, the interface does more than simply keep two materials apart. It becomes a functional part of the transistor and helps the materials work together more effectively.
Using the new interface design, the researchers fabricated short-channel top-gate transistors from CVD-grown monolayer MoS2. The devices had an equivalent oxide thickness of roughly one nanometer.
Testing showed low leakage current, minimal hysteresis, and maximum transconductance of 0.45 mS μm-1 in transistors with channels measuring about 100 nanometers.
More importantly, the devices demonstrated a combination that has been difficult to achieve in atomically thin transistors: very thin dielectric scaling, strong electrostatic control, and sustained carrier transport.
Because the researchers used CVD-grown monolayer MoS2 rather than mechanically exfoliated flakes, they believe the approach brings the technology closer to materials and processes that could eventually be suitable for wafer-scale manufacturing.
The findings also point to a broader change in the way semiconductor researchers think about transistor design.
For decades, much of the effort to improve transistors has centered on discovering better semiconductor materials or making devices smaller. As transistor components approach atomic dimensions, however, the interfaces separating different materials become increasingly important.
These regions may be only a few atoms thick, yet they can strongly influence how well the materials on either side work together. The new results add to growing evidence that controlling these atomic interfaces could become as important as developing new semiconductor materials themselves.
Image – Researchers from NYCU and TSMC show that redefining the atomic boundary between materials can address a major engineering barrier restricting the development of next-generation semiconductor devices. Courtesy of: Springer Nature.
For more information:
National Yang Ming Chiao Tung University
https://www.nycu.edu.tw/nycu/en/index
SMART Photonics partners with GlobalFoundries to offer industry’s first open access foundry service for integrated silicon and indium phosphide photonics
SMART Photonics has partnered with GlobalFoundries to offer a new open access foundry service combining GlobalFoundries’ silicon platform with SMART Photonics’ indium phosphide photonic integrated circuits.
Continue readingScientists get real-time look inside spacecraft heat shields during extreme heat conditions
Researchers at Lawrence Berkeley National Laboratory have developed a real-time 3D X-ray imaging technique to observe spacecraft heat shield ablation as it happens, improving how engineers model and design thermal protection systems for space missions.
Continue readingRigaku launches CT Lab HR160 high-resolution X-ray CT system
Rigaku Corporation, Japan, a global solutions partner in X-ray analytical systems, launched the CT Lab HR160, a high-resolution X-ray computed tomography system for battery, semiconductor devices, electronic components, and advanced materials analysis.
Continue readingTRUMPF makes glass substrates ready for the next generation of AI chips
TRUMPF, Germany, has developed the first industrial process of its kind using its HiPIMS products to coat microscopic structures in glass substrates, supporting the semiconductor industry in bringing next-generation high-performance AI processors to series production.
Continue readingHow twisting two-dimensional materials led to a new field of research
Researchers from Rutgers University, MIT, and UT Austin, supported by the U.S. Department of Energy, have been awarded the Kavli Prize in Nanoscience for pioneering ‘twistronics’, discovering that twisting two-dimensional materials like graphene unlocks novel quantum behaviors like superconductivity.
Continue readingNew analog memory may make smart devices even smarter
Researchers at Sandia National Laboratories have developed electro-thermo-chemical random-access memory, a technology that uses localized heating and electrical pulses to store a range of analog values instead of binary ones and zeros, making future electronics more energy efficient.
Continue readingFraunhofer advances in-line packaging inspection with optical coherence tomography
Researchers at the Fraunhofer Institute for Ceramic Technologies and Systems, Germany, have developed an optical coherence tomography testing system that non-destructively detects seal defects in real time during film packaging processes.
Continue readingAI helps microscopes find the most informative nanoscale features
Researchers at the Department of Energy’s Oak Ridge National Laboratory have developed SimuScan, an artificial intelligence framework that uses realistic synthetic data to train AI to identify nanoscale features and autonomously target the most informative regions of a sample.
Continue readingHitachi High-Tech opens Innovation Center Eindhoven in the Netherlands to accelerate open innovation
Hitachi High-Tech Corporation, Japan, established the Innovation Center Eindhoven at the High Tech Campus Eindhoven in the Netherlands.
Continue readingInnovative Circuits Engineering, Inc. unveils ‘eM808 bHAST’ system with advanced in-situ monitoring capabilities
Innovative Circuits Engineering Inc., San Jose, Calif., a leader in semiconductor reliability testing solutions, launched its latest innovation: the eM808 bHAST system—now enhanced with in-situ monitoring capabilities previously available only on high temperature operating life systems.
Continue readingDetecting ultra-low sulfur levels in superalloys
LECO Corporation, St. Joseph, Mich., has demonstrated how its CS844ES elemental analyzer enables accurate determination of sulfur at levels as low as 0.1 µg in steel, nickel, and superalloys, extending the combustion technique to sensitivities previously unachievable
Continue readingIntertek expands materials testing capabilities with opening of new lab in Plymouth, Michigan
Intertek, U.K., a leading total quality assurance provider to industries worldwide, has expanded its materials testing capabilities with the opening of a new lab at its Transportation Technologies facility in Plymouth, Michigan.
Continue readingBruker launches new timsMRMS mass spectrometry platform for unique ultra-complex mixture applications in the energy industry
Bruker Corporation, Billerica, Mass., launched its new timsMRMS system, designed to empower researchers in petroleomics, sustainable fuels, and advanced energy storage
Continue readingCVD Equipment Corporation sells its SDC Division
CVD Equipment Corporation, Central Islip, entered into a definitive agreement under which the Company’s Stainless Design Concepts (“SDC”) business division will become part of Atlas Copco Group, Sweden.
Continue readingHelmut Fischer ushers in a new era with the next generation of XRF devices and AI-supported software
The Helmut Fischer Group, Germany, introduced an all-new generation of its high-end segment for coating thickness measurement and material analysis using X-ray fluorescence with two devices, FISCHERSCOPE XDAL and FISCHERSCOPE XDV.
Continue readingWhy light poles failed in Hurricane Ian despite meeting design standards
A new University of Florida study reveals how hidden flaws in design and installation of aluminum light poles on a Central Florida bridge contributed to their unexpected collapse when Hurricane Ian moved across Florida in 2022, even though wind speeds remained below the structures’ design limits.
Continue readingNew AI system fixes 3D printing defects in real time
Researchers at Carnegie Mellon University, Pittsburgh, Pa., are automating 3D printing with a new large language model that fixes printer errors in real time without the need for any pre-training.
Continue readingNew sensor measures strain, strain rate, and temperature with single material layer
Researchers from the Institute of Metal Research of the Chinese Academy of Sciences have developed an innovative flexible sensor that can simultaneously detect strain, strain rate, and temperature using a single active material layer, representing a significant advance in multimodal sensing technology.
Continue readingOxford Instruments launched witec360 Raman microscope with Hexalight spectrometer
Oxford Instruments’ Raman imaging team in England announced a refreshed core microscope line and a groundbreaking new spectrometer, Hexalight, which together with the witec360 microscope constitute the most advanced confocal Raman imaging system yet devised.
Continue readingTektronix introduces 7 Series DPO, setting a new benchmark in ultra-high-performance test and measurement
Tektronix, Beaverton, Ore., announced the 7 Series DPO oscilloscope, the first in a new generation of ultra-high-performance instruments, purpose-built for engineering teams and researchers pushing the boundaries of high-speed communications, high-energy physics, AI, and quantum computing.
Continue readingTesting of laser ablation for removal of coatings, corrosion looks promising
Using lasers to remove coatings and corrosion from U.S. naval vessels may soon become a reality based on recent testing conducted by Shop 71 at the Puget Sound Naval Shipyard & Intermediate Maintenance Facility in Bremerton, Wash.
Continue readingTESCAN expands its presence in Asia
Czech-based electron microscope manufacturer TESCAN plans to establish a local subsidiary in Taiwan in 2025 to meet rising demand from semiconductor clients across the Asia-Pacific region.
Founded in Brno, the Czech Republic’s second-largest city, TESCAN built its reputation over three decades in fields like materials science and geoscience. In recent years, however, the company has pivoted toward the semiconductor industry, with a particular focus on the rapidly expanding advanced packaging segment.
TESCAN’s advanced packaging FA solution is built around a hybrid workflow that integrates scanning electron microscopy (SEM), focused ion beam (FIB), and other inspection tools into a seamless, cross-platform system. The setup aims to reduce testing time, cut labor requirements, and speed up R&D while improving yield outcomes.
Described as a “full-body checkup” for chips, the solution uses a suite of diagnostic tools—much like a team of medical specialists—to identify failure points across materials and structures. This approach has proven essential for OSAT providers, foundries, and IC design houses alike.
According to TESCAN Taiwan country manager Robert Feng, FA begins with non-destructive testing to locate potential defects without damaging the sample. The next phase involves destructive analysis using laser cutting for speed, followed by dual-beam systems to isolate and expose the faulty regions.
The process continues with SEM imaging via the dual-beam system to analyze interfaces and defect signatures. To address the rising need for structural stress and material composition analysis, TESCAN also provides a 4D STEM-enabled platform that measures internal stress fields and compositional shifts, supporting both process refinement and next-gen packaging evolution.
TESCAN’s semiconductor strategy—centered on failure analysis and advanced packaging—is gaining momentum thanks to integrated technologies and region-specific applications.
According to APAC managing director Sean Lee, the semiconductor business in Asia-Pacific contributed nearly 50% of the company’s global revenue in 2024. “There’s still plenty of room to grow,” he said.
For 2025, Lee projects a 40% revenue surge in APAC, fueled largely by Chinese demand, with semiconductor-related sales expected to account for about half of that growth.
As a challenger in the semiconductor equipment space, TESCAN is still trailing global leaders in market share. To gain ground, the company is leaning into product flexibility and differentiation.
Lee highlights technologies such as CoWoS, 2.5D/3D, and heterogeneous integration as major drivers of increased FA complexity. TESCAN’s strategy focuses on large-format and customized inspection demands, delivering broader and deeper coverage tailored to client-specific requirements.
TESCAN’s edge, Lee says, lies in its singular focus: “We only do electron microscopes.” Unlike competitors with sprawling product portfolios, the company offers more streamlined and responsive collaboration.
Most equipment vendors favor standardized models to maximize cost and production efficiency. TESCAN, however, starts with the unmet needs of leading customers and gradually scales into more price-sensitive segments—a strategy built on flexibility and differentiation.
Across the region, Lee says, packaging customers want FA tools that are faster, more precise, and competitively priced. TESCAN has targeted sample preparation, the bottleneck in the testing workflow, and introduced AI and machine learning to streamline it. The result: faster output, fewer manual errors, and relief for an industry plagued by skilled labor shortages.
Feng notes that training an operator in sample preparation and analysis typically takes six to twelve months. But with product lifecycles shrinking, delays are no longer acceptable. TESCAN’s solution reduces prep time from four hours to under one, even for first-time users.
Lee points out that Taiwan and China together account for over 70% of the global advanced packaging market. Many Chinese customers are Taiwan-owned or managed by Taiwanese executives, making Greater China the most critical hub for packaging technology and a core driver of TESCAN’s APAC expansion.
Although Lee concedes that launching the Taiwan office in 2025 is “a beat late” and would have been better timed two years earlier, he believes conditions remain favorable. As client technologies mature and US-China chip tensions intensify, China’s localization drive makes this an opportune moment.
Following the acquisitions of TESCAN Korea and anti-vibration system maker Daeil Microanalysis Laboratory (DML), the company will open new subsidiaries in Taiwan and Singapore in 2025. Moving away from agent-based distribution marks a major step in strengthening brand visibility and service capabilities across the APAC semiconductor market.
In the past, Taiwan clients relied on local agents for sales and service, which created delays in communicating feedback to TESCAN’s R&D hub in the Czech Republic, slowing development and impeding local adaptation.
To avoid missing out on co-innovation opportunities, TESCAN opted to establish its subsidiaries, enabling technical teams to work directly with clients. This move shortens communication loops, accelerates market responsiveness, and enhances local support across key APAC markets—including Taiwan, China, South Korea, and Malaysia—while deepening regional collaboration.
Image – Sean Lee (L) and Robert Feng (R). Courtesy of: DIGITIMES.
For more information:
TESCAN
https://www.tescan.com/
Extended slip bands discovery provides new insight into material deformation under stress
Scientists at the University of California, Irvine, recently expanded on a longstanding model governing the mechanics behind slip banding, a process that produces strain marks in metals under compression, gaining a new understanding of the behavior of advanced materials critical to energy systems, space exploration, and nuclear applications.
Continue readingGroundbreaking microscopy unveils quantum dance of atoms in twisted graphene
Researchers at the Weizmann Institute of Science, Israel, introduce a novel powerful tool—the cryogenic quantum twisting microscope—to explore quantum phenomena.
Continue readingiST launches Global Smart Reliability Center to accelerate front-end validation for AI and EV applications
Integrated Service Technology Inc., Taiwan, a leading provider of electronic product verification and analysis services, launched its Global Smart Reliability Center, developed in response to the growing demand for early-stage reliability testing in AI, high-performance computing, and electric vehicle applications.
Continue readingSigray unveils the Apex-Hybrid: a breakthrough 3D x-ray system for failure analysis and electronics reverse engineering
Sigray, Inc. of Benicia, Calif. has launched the Apex-Hybrid, a breakthrough X-ray system designed to revolutionize failure analysis in semiconductor and electronics labs with interchangeable laminography and tomography modes, delivering exceptional speed and 350nm high-resolution imaging for everything from large packages and PCBs to the smallest components.
Continue readingBruker Introduces eWARP, a pioneering new EBSD detector for advanced materials characterization in scanning electron microscopes
Bruker, Billerica, Mass., launched eWARP, a new electron backscatter diffraction detector that combines direct electron detection and CMOS technologies to provide the fastest and most signal-efficient materials characterization in scanning electron microscopes.
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