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1458 items found
ARM joins global research collaboration for continued scaling of semiconductors
Published: November 15, 2015
Semiconductor Research Corp., Research Triangle Park, N.C., announces that Arm Ltd., San Jose, Calif., has joined its Global Research Collaboration program.
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Jeol SEM features expanded EDS analysis, hi-res imaging, and ports for multiple detectors
Published: November 15, 2015
Jeol USA, Peabody, Mass., introduces the JSM-IT100 scanning electron microscope, which features expanded EDS analysis capabilities and ports for multiple detectors.
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Global semiconductor sales increase by 1.5% in third quarter
Published: November 15, 2015
The Semiconductor Industry Association (SIA), Washington, announces that worldwide sales of semiconductors reached $85.2 billion during the third quarter of 2015, an increase of 1.5% compared to the previous quarter.
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FEI acquires DCG for electrical fault characterization and editing equipment
Published: November 13, 2015
FEI Co., Hillsboro, Ore., has acquired DCG Systems, Fremont, Calif., a leading supplier of electrical fault characterization, localization, and editing equipment for a wide range of semiconductor and electronics manufacturers.
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Semiconductor testing method efficiently measures uniformity of conductivity
Published: November 13, 2015
Northwestern University, Evanston, Ill., reports that a new method of semiconductor characterization that is more accurate, efficient, and simple than existing methods has been developed by its researchers.
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Vanadium dioxide thin films added to transistors improve energy efficiency
Published: November 13, 2015
Scientists at Penn State University, University Park, have reportedly discovered a way to incorporate vanadium dioxide thin films into transistors and memory devices to improve energy efficiency and robustness.
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Ultratech introduces Superfast 4G+ in-line wafer inspection system
Published: November 13, 2015
Ultratech Inc., San Jose, Calif., introduces the Superfast 4G+ in-line 3D topography wafer inspection system featuring coherent gradient sensing technology that enables a single wafer inspection tool to measure patterned wafers across the entire fab line at the lowest cost.
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Ipsen furnace enables California Brazing to increase aluminum brazing capacity
Published: November 11, 2015
Ipsen USA, Cherry Valley, Ill., reports that California Brazing recently purchased its third vacuum aluminum brazing (VAB) furnace from Ipsen, to expand capacity and manufacture a variety of aluminum-brazed assemblies.
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Nomination deadline for the 2016 Class of Fellows is fast approaching
Published: November 05, 2015
The honor of Fellow of the Society was established to provide recognition to members for distinguished contributions in the field of materials science and engineering, and to develop a broadly based forum for technical and professional leaders to serve as advisors to the Society. The deadline for submission is November 30.
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ASM Handbooks Online now includes Volume 5B: Protective Organic Coatings
Published: October 29, 2015
ASM International, Materials Park, Ohio, recently released ASM Handbooks Online, which features the addition of ASM Handbook, Volume 5B: Protective Organic Coatings.
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