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1458 items found
Time-of-flight secondary ion mass spectroscopy helps to detect counterfeit parts
Published: July 19, 2020
Engineers from MuAnalysis, Ion-Tof USA, and Tascon GmbH demonstrated how time-of-flight secondary ion mass spectroscopy provides unique information to identify suspected counterfeit semiconductor devices in a presentation from the ASM International ISTFA 2019 conference in Portland, Oregon.
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ON semiconductor infrared microscopy techniques minimize secondary cracks
Published: July 19, 2020
Engineers from ON Semiconductor, Japan, reported at the ASM International ISTFA 2019 conference in Portland, Oregon, that two of the most challenging tasks in analyzing fractures are a die that has not been fully cracked apart and a cracked die with electrical overstress damage.
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Jeol’s JSM-IT800 ultrahigh-resolution field emission SEM is being demonstrated online
Published: July 19, 2020
Jeol USA, Peabody, Mass., announces that the launch of its new field emission scanning electron microscope during the summer of 2020 includes virtual demonstrations of its powerful performance directly to those in the market for an analytical ultrahigh resolution SEM.
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Rigaku Onyx metrology tool measures semiconductor ultrathin films, multilayer stacks
Published: July 19, 2020
Rigaku, Japan, reports that its Onyx 3000 instrument combines advanced X-ray and optical techniques, offering unique metrology approaches in many areas, leading to in-line solutions for these processes.
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Worldwide semiconductor sales increase 1.5 percent month-to-month in May
Published: July 18, 2020
The Semiconductor Industry Association (SIA), Washington, announces that worldwide sales of semiconductors were $35.0 billion in May 2020, an increase of 5.8 percent from the May 2019 total of $33.0 billion and 1.5 percent more than the April 2020 total of $34.4 billion.
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Imec and Global Foundries demonstrate chip optimized for calculations in memory devices
Published: July 18, 2020
Imec, Belgium, and Global Foundries, Santa Clara, Calif., announce a hardware demonstration of a new artificial intelligence chip.
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Analog Devices to acquire Maxim Integrated to increase breadth and scale of markets
Published: July 18, 2020
Analog Devices Inc., Norwood, Mass., and Maxim Integrated Products Inc., San Jose, Calif., announce that they have entered into a definitive agreement under which ADI will acquire Maxim in an all-stock transaction that values the combined enterprise at over $68 billion.
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Bruker’s e-Flash XS EBSD detector designed for entry-level scanning electron microscopes
Published: July 15, 2020
Bruker, Berlin, introduces the e-Flash XS, a new electron backscatter diffraction detector which, for the first time, enables the characterization of the microstructure of crystalline materials in tabletop and other small, entry-level scanning electron microscopes.
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Synopsys acquires Qualtera for its big data analytics for semiconductor testing
Published: June 21, 2020
Synopsys Inc., Mountain View, Calif., has acquired Qualtera, a fast-growing provider of collaborative high-performance, big data analytics for semiconductor test and manufacturing.
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Semicaps scanning optical microscope determines fault localization with high resolution
Published: June 20, 2020
Semicaps scanning optical microscope determines fault localization with high resolution Semicaps Corp. Ltd., Singapore, offers the Semicaps scanning optical microscope for fault localization of integrated circuits using laser-induced phenomena.
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