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1458 items found
Hitachi High-Tech Corporation receives Intel’s Preferred Quality Supplier Award
Published: March 15, 2020
Hitachi High-Tech Corporation, Tokyo, has been recognized by Intel as a recipient of a 2019 Preferred Quality Supplier (PQS) award, by which Intel recognizes companies such as Hitachi High-Tech that Intel believes have relentlessly pursued excellence and conducted business with resolute professionalism
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Ametek Gatan K3 camera provides first 3D atomic-scale map of coronavirus structure
Published: March 15, 2020
Ametek Gatan, Berwyn, Pa., reports that researchers at the University of Texas at Austin and the National Institutes of Health created the first 3D atomic-scale map of the 2019 novel coronavirus.
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Mentor Graphics Quantix Examinator enables desktop semiconductor test data analysis
Published: March 15, 2020
Mentor Graphics, Wilsonville, Oregon, offers the Quantix Examinator-Pro, which provides product and test engineers everything they need to characterize new ICs and test programs. It turns standard test data files into comprehensive reports, and enables engineers to drill down into the data interactively for root-cause analysis.
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Lam transforms plasma etch technology to enable advanced functionality and extendibility
Published: March 15, 2020
Lam Research Corp., Fremont, Calif., announces the launch of a completely transformed plasma etch technology and system solution, designed to provide chipmakers with advanced functionality and extendibility required for future innovation.
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Federal interagency working group to prioritize semiconductor R&D across U.S. agencies
Published: March 15, 2020
The Semiconductor Industry Association (SIA), Washington, reports that the White House Office of Science and Technology Policy (OSTP) has announced a new interagency working group focused on advancing semiconductor R&D.
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Oxford Instruments Xplore EDS detector offers rapid data collection for live EDS analysis
Published: February 24, 2020
Oxford Instruments, England, introduces the Xplore EDS detector, available with a 30 mm2 sensor area and designed for a wide range of applications.
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Samsung Electronics begins mass production of semiconductors at South Korean facility
Published: February 24, 2020
Samsung Electronics Co. Ltd., South Korea, announces that its South Korean facility has begun its first semiconductor mass production line dedicated to the extreme ultraviolet (EUV) lithography technology and to production of chips using a process node of 7 nanometer (nm) and below.
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EDAX introducing the Clarity EBSD detector based on direct electron detection technology
Published: February 24, 2020
EDAX, Mahwah, N.J., is planning to release the Clarity electron backscatter diffraction (EBSD) detector, the world’s first commercial EBSD-specific detector based on direct electron detection technology.
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Jeol USA introduces field emission SEM featuring NeoEngine analytical intelligence
Published: February 24, 2020
Jeol USA, Peabody, Mass., introduces a new field emission scanning electron microscope with several features unique to the company’s FE SEM product line.
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SEMI and VLSI Research to publish semiconductor manufacturing industry report
Published: February 23, 2020
SEMI, Milpitas, Calif.; and VLSI Research, San Jose, Calif., announce that they will publish Semiconductor Manufacturing Monitor, a report covering the semiconductor manufacturing industry from materials to electronic systems.
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