Failure Analysis of Ultra-Efficient Electronics

Join us for the 53rd International Symposium for Testing and Failure Analysis (ISTFA)
October 31 - November 4, 2027 | Phoenix, Arizona

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Plan Today to Attend and Participate at ISTFA 2027!

       

With a focus on both theoretical and practical applications, ISTFA 2027 promises to be an invaluable platform for professionals looking to enhance their expertise and stay at the forefront of microelectronics testing and failure analysis.

This premier gathering is your one-stop destination for leading-edge training, networking, and business opportunities across all market segments.

ISTFA 2027 (International Symposium for Testing and Failure Analysis)

Join us for the 53rd International Symposium for Testing and Failure Analysis (ISTFA) which is set to take place in Phoenix, Arizona, from October 31 – November 4, 2027. As the premier event for the microelectronics failure analysis community, ISTFA brings together leading experts, industry professionals, and researchers to share insights, innovations, and methodologies in the field. Attendees will engage in a comprehensive program that includes keynote presentations, technical sessions, workshops, and networking opportunities, all designed to foster collaboration and knowledge exchange.

ISTFA 2026 WINNERS

TO BE ANNOUNCED SOON