Jeol USA, Peabody, Mass., introduces a new field emission scanning electron microscope with several features unique to the company’s FE SEM product line. For example, the NeoEngine employs analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered optics of the SEM.
NeoEngine corrects electron trajectories and automatically aligns the beam in real time, plus it automatically corrects focus, brightness/contrast, and astigmatism. The SEM achieves single-digit Angstrom resolution at low kV, ideal for ultrahigh high-resolution imaging of nanostructures, specimen surface details, biological specimens, and magnetic samples, as well as elemental analysis of non-conductive and beam sensitive samples.
Fully embedded EDS with Live Analysis allows the user to simply select the area, mapping, line, or another type of analysis directly on the observation screen to begin automatic live display of the elements in the specified location.
The large specimen chamber of the JSM-F100 features multiple ports for analytical applications: EDS, WDS, EBSD, STEM, BSE, and CL. An optional soft X-ray emission spectrometer provides efficient and parallel collection of very low-energy X-rays while providing unprecedented chemical state analysis.
www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/FE-SEM
