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ASM International
Home Nanotechnology

Nickel-titanium SMA developed for elastocaloric cooling via additive manufacturing

The Alliance for the Development of Additive Processing Technologies (ADAPT) at Colorado School of Mines announces that its scientists are part of an international research team that developed a new nickel-titanium elastocaloric cooling alloy that is highly efficient, eco-friendly, and easily scaled up.

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Thermo Fisher Scientific designs Metrios AX S/TEM to improve semiconductor failure analysis

Thermo Fisher Scientific, Portland, Oregon, announces the Thermo Scientific Metrios AX, the world’s first commercially released scanning transmission electron microscope (S/TEM) to use machine learning to automate high-quality data collection.

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Murata multi-layer ceramic capacitor is 50 times smaller than conventional capacitors

Murata Electronics North America, Smyrna, Ga., announces that the company has developed the world’s first multi-layer ceramic capacitor, with 0.1μF dimensions of 0.25×0.125 mm.

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Semiconductor sales increase 2.9% in October; 2019 sales projected to decrease by 12.8%

The Semiconductor Industry Association (SIA), Washington, reports that worldwide sales of semiconductors reached $36.6 billion for the month of October 2019, an increase of 2.9 percent from the previous month’s total of $35.6 billion.

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SEMI forecasts equipment sales will rebound in 2020, reach record high in 2021

SEMI, Milpitas, Calif., in its Year-End Total Equipment Forecast, predicts that global semiconductor manufacturing equipment sales will drop by 10.5 percent to $57.6 billion in 2019 from 2018, but will recover in 2020 and set a new high in 2021.

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Rigaku installs two x-ray dispersive instruments at Covalent Metrology lab

Rigaku Corp., Sunnyvale, Calif., announces the installation, in the recently-expanded Covalent Metrology Sunnyvale service lab, of two of its newest analytical instruments: the Rigaku AZX400 sequential wavelength dispersive x-ray fluorescence (WDXRF) spectrometer, and the CT Lab HX system.

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Applied Materials opens Materials Engineering Technology Accelerator

Applied Materials Inc., Santa Clara, Calif., announces the opening of the Materials Engineering Technology Accelerator (META Center), a first-of-its-kind facility aimed at speeding customer prototyping of new materials, process technologies, and devices.

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Zeiss innovations improve accuracy of 3D tomography, speed FIB-SEM sample preparation

Zeiss Microcopy, Germany, announces new extensions on Zeiss Crossbeam 350/550 and Zeiss Atlas 5 that enable faster accessibility to deeper regions of interest when investigating material samples in three dimensions.

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Bruker Quantax EDS software suite can integrate all four microanalysis techniques

Bruker Corp., Oak Park, Ill., introduces its Quantax Compact EDS system, which consists of an XFlash 600 Mini silicon drift detector (SDD), a small electronics unit, and Eprit Compact intuitive software.

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IBM Japan, Panasonic collaborate to improve semiconductor manufacturing processes

IBM Japan Ltd. and Panasonic Smart Factory Solutions Co. Ltd., announce that the companies have agreed to collaborate to develop and market a new high-value-added system to optimize the overall equipment effectiveness of semiconductor manufacturing processes and to achieve high-quality manufacturing.

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NanoScientific Symposium on Scanning Probe Microscopy to be held at SUNY Polytechnic

Park Systems NanoScience Center at SUNY Polytechnic Institute, Albany, N.Y., announces that the second symposium on scanning probe microscopy will be presented November 19 – 20 at the Center.

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Study aims to find optimized electron energy range for voltage contrast in failure analysis

Researchers from JEOL Ltd., Japan, and JEOL USA, Peabody, Mass., will present a discussion about voltage contrast (VC) observation using a scanning electron microscope (SEM) and focused ion beam (FIB) at the ISTFA 2019 conference in November in Portland, Oregon.

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Bruker D8 Discover Plus x-ray diffraction instrument features highly parallel x-ray beam

Bruker Corp., Billerica, Mass., has released the D8 Discover Plus x-ray diffraction (XRD) solutions, featuring the new non-coplanar arm and the Montel Plus x-ray optics.

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Zeiss Xradia RepScan measures submicron dimensions of buried features in packages

Zeiss, Pleasanton, Calif., introduces the Zeiss Xradia 620 Versa RepScan, a submicron-resolution, 3D nondestructive imaging solution for inspection and measurement that accelerates time to market for advanced IC packages.

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Imec develops improved test vehicle for localization of dielectric breakdown sites

Imec, Belgium, has developed a dual-damascene 21nm-pitch test vehicle relevant for manufacturing the 3nm logic technology node.

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SEMI World Fab Forecast predicts new fab projects will reach nearly $50 billion in 2020

Semi, Milpitas. Calif., reports in its World Fab Forecast that investments in new fab projects starting construction in 2020 are expected to reach nearly $50 billion, up about $12 billion from 2019.

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Cerebras Systems develops wafer scale engine chip with 1.2 trillion transistors

Cerebras Systems, Los Altos, Calif., a startup dedicated to accelerating artificial intelligence computing, announces that it has developed the largest chip ever built: a WSE chip with 71.6 square inches of area.

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Binghamton University to acquire $1.75M HAXPES x-ray system for materials research

Binghamton University, New York, announces that the school will acquire a HArd x-ray Photoelectron Spectroscopy system (or HAXPES), which allows researchers to get detailed information about a device or material without taking it apart.

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Zeiss ion beam microscopes feature advances in analytics, tomography, data integrity

Zeiss, Germany, announces that its ion beam microscopes now have new capabilities that cover advancements in analytics, tomography, sample preparation, and data integrity.

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Picosun plasma-enhanced ALD coating process replaces ions with low-energy radicals

Picosun Group, Finland, reports excellent results obtained with its next generation PEALD (plasma-enhanced ALD) technology, which enables deposition at low temperatures and of several materials that could not be deposited with thermal processes only.

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Bruker Hysitron TS 77 test system designed to measure nanometers to micrometers

Bruker, Billerica, Mass., introduces the Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system, which is built around Bruker’s TriboScope capacitive transducer technology.

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Ametek Edax OIM Matrix software enables EBSD simulations and dictionary indexing

Ametek Edax Inc., Mahwah, N.J., introduces the OIM Matrix software package, which brings dynamic diffraction-based electron backscatter diffraction (EBSD) pattern simulations and dictionary indexing capabilities to the EBSD market.

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Thermo Scientific Helios Hydra DualBeam SEM delivers four different ions as primary beam

Thermo Scientific, Hillsboro, Oregon, announces that researchers can now apply a range of ion beam species within one focused ion beam scanning electron microscope with the new Helios Hydra DualBeam system.

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Advantest V93000 Wave Scale Millimeter Solution is finalist in Best of West awards

SEMI Americas, Milpitas, Calif., and Semiconductor Digest announce that Advantest, Tokyo, was a finalist in the Best of West awards for its V93000 Wave Scale Millimeter Solution, which has been extended to support multi-band testing at the fast interface speeds used by 5G devices.

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Samsung Electronics selects Optomec’s Aerosol Jet for next-generation electronics production

Optomec, Albuquerque, N.M., announces that Samsung Electronics has commissioned an Aerosol Jet 5X System in its Printed Electronics Lab to enable next-generation electronics production.

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CyberOptics nanoresolution MRS sensor wins 2019 Best of West Award at SEMICON West

CyberOptics Corp., Minneapolis, Minn., announces that it has won the 2019 Best of West award for the new NanoResolution MRS (Multi-Reflection Suppression) sensor, which “meticulously identifies and rejects multiple reflections caused by shiny components and mirror-like surfaces.”

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Purdue and Taiwan Semiconductor join to build secure semiconductor pipeline

Purdue University, West Lafayette, Ind., and the Taiwan Semiconductor Manufacturing Co. (TSMC), jointly announce plans to establish a Center for Secured Microelectronics Ecosystem.

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New microscope based on coherent extreme ultraviolet/vacuum ultraviolet laser sources

KMLabs Inc., Boulder, Colorado, introduces the QM Quantum Microscope for next-generation imaging and analysis.

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Iron-based shape-memory alloy cables evaluated for large-scale assemblies

Researchers from Fort Wayne Metals, Texas A&M University, and NASA Glenn Research Center reported on a new class of iron-based shape-memory alloy cables in “Superelastic Fe-based Shape Memory Alloy Cables,” a presentation at the ASM International SMST 2019 conference in May.

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IMT’s eight-inch wafer fabrication capabilities double the number of devices per wafer

Innovative Micro Technology Inc. (IMT), Santa Barbara, Calif., announces that it is now offering eight-inch (200 mm) wafer fabrication capabilities, thereby improving the economics of MEMS production by yielding roughly twice the number of devices per wafer.

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