The Alliance for the Development of Additive Processing Technologies (ADAPT) at Colorado School of Mines announces that its scientists are part of an international research team that developed a new nickel-titanium elastocaloric cooling alloy that is highly efficient, eco-friendly, and easily scaled up.
Continue readingThermo Fisher Scientific designs Metrios AX S/TEM to improve semiconductor failure analysis
Thermo Fisher Scientific, Portland, Oregon, announces the Thermo Scientific Metrios AX, the world’s first commercially released scanning transmission electron microscope (S/TEM) to use machine learning to automate high-quality data collection.
Continue readingMurata multi-layer ceramic capacitor is 50 times smaller than conventional capacitors
Murata Electronics North America, Smyrna, Ga., announces that the company has developed the world’s first multi-layer ceramic capacitor, with 0.1μF dimensions of 0.25×0.125 mm.
Continue readingSemiconductor sales increase 2.9% in October; 2019 sales projected to decrease by 12.8%
The Semiconductor Industry Association (SIA), Washington, reports that worldwide sales of semiconductors reached $36.6 billion for the month of October 2019, an increase of 2.9 percent from the previous month’s total of $35.6 billion.
Continue readingSEMI forecasts equipment sales will rebound in 2020, reach record high in 2021
SEMI, Milpitas, Calif., in its Year-End Total Equipment Forecast, predicts that global semiconductor manufacturing equipment sales will drop by 10.5 percent to $57.6 billion in 2019 from 2018, but will recover in 2020 and set a new high in 2021.
Continue readingRigaku installs two x-ray dispersive instruments at Covalent Metrology lab
Rigaku Corp., Sunnyvale, Calif., announces the installation, in the recently-expanded Covalent Metrology Sunnyvale service lab, of two of its newest analytical instruments: the Rigaku AZX400 sequential wavelength dispersive x-ray fluorescence (WDXRF) spectrometer, and the CT Lab HX system.
Continue readingApplied Materials opens Materials Engineering Technology Accelerator
Applied Materials Inc., Santa Clara, Calif., announces the opening of the Materials Engineering Technology Accelerator (META Center), a first-of-its-kind facility aimed at speeding customer prototyping of new materials, process technologies, and devices.
Continue readingZeiss innovations improve accuracy of 3D tomography, speed FIB-SEM sample preparation
Zeiss Microcopy, Germany, announces new extensions on Zeiss Crossbeam 350/550 and Zeiss Atlas 5 that enable faster accessibility to deeper regions of interest when investigating material samples in three dimensions.
Continue readingBruker Quantax EDS software suite can integrate all four microanalysis techniques
Bruker Corp., Oak Park, Ill., introduces its Quantax Compact EDS system, which consists of an XFlash 600 Mini silicon drift detector (SDD), a small electronics unit, and Eprit Compact intuitive software.
Continue readingIBM Japan, Panasonic collaborate to improve semiconductor manufacturing processes
IBM Japan Ltd. and Panasonic Smart Factory Solutions Co. Ltd., announce that the companies have agreed to collaborate to develop and market a new high-value-added system to optimize the overall equipment effectiveness of semiconductor manufacturing processes and to achieve high-quality manufacturing.
Continue readingNanoScientific Symposium on Scanning Probe Microscopy to be held at SUNY Polytechnic
Park Systems NanoScience Center at SUNY Polytechnic Institute, Albany, N.Y., announces that the second symposium on scanning probe microscopy will be presented November 19 – 20 at the Center.
Continue readingStudy aims to find optimized electron energy range for voltage contrast in failure analysis
Researchers from JEOL Ltd., Japan, and JEOL USA, Peabody, Mass., will present a discussion about voltage contrast (VC) observation using a scanning electron microscope (SEM) and focused ion beam (FIB) at the ISTFA 2019 conference in November in Portland, Oregon.
Continue readingBruker D8 Discover Plus x-ray diffraction instrument features highly parallel x-ray beam
Bruker Corp., Billerica, Mass., has released the D8 Discover Plus x-ray diffraction (XRD) solutions, featuring the new non-coplanar arm and the Montel Plus x-ray optics.
Continue readingZeiss Xradia RepScan measures submicron dimensions of buried features in packages
Zeiss, Pleasanton, Calif., introduces the Zeiss Xradia 620 Versa RepScan, a submicron-resolution, 3D nondestructive imaging solution for inspection and measurement that accelerates time to market for advanced IC packages.
Continue readingImec develops improved test vehicle for localization of dielectric breakdown sites
Imec, Belgium, has developed a dual-damascene 21nm-pitch test vehicle relevant for manufacturing the 3nm logic technology node.
Continue readingSEMI World Fab Forecast predicts new fab projects will reach nearly $50 billion in 2020
Semi, Milpitas. Calif., reports in its World Fab Forecast that investments in new fab projects starting construction in 2020 are expected to reach nearly $50 billion, up about $12 billion from 2019.
Continue readingCerebras Systems develops wafer scale engine chip with 1.2 trillion transistors
Cerebras Systems, Los Altos, Calif., a startup dedicated to accelerating artificial intelligence computing, announces that it has developed the largest chip ever built: a WSE chip with 71.6 square inches of area.
Continue readingBinghamton University to acquire $1.75M HAXPES x-ray system for materials research
Binghamton University, New York, announces that the school will acquire a HArd x-ray Photoelectron Spectroscopy system (or HAXPES), which allows researchers to get detailed information about a device or material without taking it apart.
Continue readingZeiss ion beam microscopes feature advances in analytics, tomography, data integrity
Zeiss, Germany, announces that its ion beam microscopes now have new capabilities that cover advancements in analytics, tomography, sample preparation, and data integrity.
Continue readingPicosun plasma-enhanced ALD coating process replaces ions with low-energy radicals
Picosun Group, Finland, reports excellent results obtained with its next generation PEALD (plasma-enhanced ALD) technology, which enables deposition at low temperatures and of several materials that could not be deposited with thermal processes only.
Continue readingBruker Hysitron TS 77 test system designed to measure nanometers to micrometers
Bruker, Billerica, Mass., introduces the Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system, which is built around Bruker’s TriboScope capacitive transducer technology.
Continue readingAmetek Edax OIM Matrix software enables EBSD simulations and dictionary indexing
Ametek Edax Inc., Mahwah, N.J., introduces the OIM Matrix software package, which brings dynamic diffraction-based electron backscatter diffraction (EBSD) pattern simulations and dictionary indexing capabilities to the EBSD market.
Continue readingThermo Scientific Helios Hydra DualBeam SEM delivers four different ions as primary beam
Thermo Scientific, Hillsboro, Oregon, announces that researchers can now apply a range of ion beam species within one focused ion beam scanning electron microscope with the new Helios Hydra DualBeam system.
Continue readingAdvantest V93000 Wave Scale Millimeter Solution is finalist in Best of West awards
SEMI Americas, Milpitas, Calif., and Semiconductor Digest announce that Advantest, Tokyo, was a finalist in the Best of West awards for its V93000 Wave Scale Millimeter Solution, which has been extended to support multi-band testing at the fast interface speeds used by 5G devices.
Continue readingSamsung Electronics selects Optomec’s Aerosol Jet for next-generation electronics production
Optomec, Albuquerque, N.M., announces that Samsung Electronics has commissioned an Aerosol Jet 5X System in its Printed Electronics Lab to enable next-generation electronics production.
Continue readingCyberOptics nanoresolution MRS sensor wins 2019 Best of West Award at SEMICON West
CyberOptics Corp., Minneapolis, Minn., announces that it has won the 2019 Best of West award for the new NanoResolution MRS (Multi-Reflection Suppression) sensor, which “meticulously identifies and rejects multiple reflections caused by shiny components and mirror-like surfaces.”
Continue readingPurdue and Taiwan Semiconductor join to build secure semiconductor pipeline
Purdue University, West Lafayette, Ind., and the Taiwan Semiconductor Manufacturing Co. (TSMC), jointly announce plans to establish a Center for Secured Microelectronics Ecosystem.
Continue readingNew microscope based on coherent extreme ultraviolet/vacuum ultraviolet laser sources
KMLabs Inc., Boulder, Colorado, introduces the QM Quantum Microscope for next-generation imaging and analysis.
Continue readingIron-based shape-memory alloy cables evaluated for large-scale assemblies
Researchers from Fort Wayne Metals, Texas A&M University, and NASA Glenn Research Center reported on a new class of iron-based shape-memory alloy cables in “Superelastic Fe-based Shape Memory Alloy Cables,” a presentation at the ASM International SMST 2019 conference in May.
Continue readingIMT’s eight-inch wafer fabrication capabilities double the number of devices per wafer
Innovative Micro Technology Inc. (IMT), Santa Barbara, Calif., announces that it is now offering eight-inch (200 mm) wafer fabrication capabilities, thereby improving the economics of MEMS production by yielding roughly twice the number of devices per wafer.
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