Researchers from Fort Wayne Metals, Texas A&M University, and NASA Glenn Research Center reported on a new class of iron-based shape-memory alloy cables in “Superelastic Fe-based Shape Memory Alloy Cables,” a presentation at the ASM International SMST 2019 conference in May.
Continue readingIMT’s eight-inch wafer fabrication capabilities double the number of devices per wafer
Innovative Micro Technology Inc. (IMT), Santa Barbara, Calif., announces that it is now offering eight-inch (200 mm) wafer fabrication capabilities, thereby improving the economics of MEMS production by yielding roughly twice the number of devices per wafer.
Continue readingSintavia opens additive manufacturing facility for large-scale aerospace production
Sintavia LLC, Hollywood, Fla., has opened the doors to its new 55,000-square-foot advanced manufacturing facility, which is said to be the first of its kind in North America to offer large-scale AM production coupled with a robust aerospace quality management system.
Continue readingIntel Custom Foundry to collaborate with USC for integrated circuit design and fabrication
The University of Southern California’s Viterbi Information Sciences Institute (ISI) and Intel Custom Foundry announce a collaboration to design, fabricate, and package integrated circuits through its MOSIS unit.
Continue readingNanotronics patented Super Resolution imaging system identifies defects in less time
Nanotronics, Brooklyn, N.Y., has expanded its Super Resolution imaging system portfolio with a new patented system that identifies and classifies defects at lower resolutions than traditional inspection microscopy, providing faster scan times and enhanced throughput.
Continue readingU.S. semiconductor industry calls for federal policies to promote advanced chip technology
The Semiconductor Industry Association, Washington, has released a set of government policy recommendations for sustaining and strengthening America’s global leadership in semiconductor technology and ensuring that the United States wins the race to harness the transformative semiconductor-enabled technologies of the future.
Continue readingCopper nanoparticle pastes bond copper plates into possible future electrodes
Scientists at Tohoku University in Japan report that they fabricated an electrode by printing copper nanoparticle-based nanopastes onto a glass substrate using a metal screen mask and pressureless sintering under a nitrogen atmosphere at 200°C for 30 minutes.
Continue readingRave mask repair/cleaning business now part of Bruker semiconductor metrology division
Bruker Corp., Billerica, Mass., announces that it has acquired the semiconductor mask repair and cleaning business of Rave LLC, a leading provider of nanomachining and laser photomask repair equipment. For calendar year 2018, the acquired business was profitable and had revenues of approximately $25 million. Financial details of the transaction were not disclosed, and the business has now become part of Bruker’s semiconductor metrology division.
Continue readingAbstract from SMST 2019: A Nitinol-tantalum composite for high plateau stress
Previous studies showed that niobium can largely increase martensitic transformation stresses, stiffness, and radiopacity of NiTi alloys, which are highly demanded by many medical applications.
Continue readingDualBeam FIB-SEM microscope for semiconductors includes new feedback systems
Thermo Fisher Scientific, Waltham, Mass., introduces its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer-scale materials characterization and analysis: the Thermo Scientific Helios 5 DualBeam microscope.
Continue readingWitec analysis tool enables Raman microscopes to identify and classify particles
Witec GmbH, Germany, pioneer of Raman imaging and correlative microscopy, introduces ParticleScout, a particle analysis tool that enables researchers to find, classify, quantify, and identify particles quickly and easily with the Alpha300 Raman microscope series.
Continue readingRigaku EDXRF instrument analyzes elements from Na through U in almost any matrix
Rigaku, Japan, announces the newest addition to the NEX DE series, the Rigaku NEX DE VS direct excitation variable-spot EDXRF elemental analyzer, which is uniquely suited for small spot analysis applications.
Continue readingKeyence 3D Scanner CMM VL Series captures surface data and color information
Keyence, Itasca, Ill., has launched its new VL Series of 3D Scanner CMM, which provides a structured light scanner with full 360 degree measurement and claims fully traceable measurements of ±10 μm accuracy with 2 µm repeatability.
Continue readingAustralian scientists develop molten metal catalyst to change carbon dioxide into coal
RMIT University in Melbourne, Australia, announces that its researchers have developed a molten metal catalyst technique that can efficiently convert carbon dioxide from a gas into solid particles of carbon.
Continue readingSRC sponsors semiconductor packaging research center at Purdue and Binghamton
Purdue University, West Lafayette, Ind., announces the formation of the Center for Heterogeneous Integration Research in Packaging, or CHIRP, a new multimillion dollar semiconductor research center that will be co-directed by Ganesh Subbarayan, professor of mechanical engineering at Purdue, and Bahgat Sammakia, vice president for research and a distinguished professor of mechanical engineering at Binghamton University, New York.
Continue readingNickel sheet with nanoscale pores weighs less than titanium but is just as strong
In a new study published in Nature Scientific Reports, university researchers announce that they have fabricated a sheet of nickel with nanoscale pores that make it as strong as titanium but four to five times lighter.
Continue readingTitanium carbide nanoparticles infused into aluminum alloy 7075 enable strong welds
Engineers at the UCLA Samueli School of Engineering announce that they have developed a way to weld aluminum alloy AA 7075 by infusing titanium carbide nanoparticles into welding wires, which results in welded joints with a tensile strength up to 392 MPa.
Continue readingAtomic force microscope from Asylum Research scans surface ten times faster at high resolution
Oxford Instruments Asylum Research, U.K., introduces the Cypher VRS AFM, a full-featured video-rate atomic force microscope that enables researchers to measure nanoscale dynamic processes at video-rate speeds with all of the resolution, versatility, and ease of use of an Asylum Research Cypher AFM.
Continue readingBruker completes acquisition of Alicona for its optical 3D surface measurement solutions
Bruker Corp., Billerica, Mass., announces that it has completed its previously announced acquisition of Alicona Imaging GmbH, a leading provider of optical-based metrology products in Austria.
Continue readingTescan USA welcomes EDFAS member Dr. Lucille Giannuzzi as Regional Sales Manager
Tescan USA Inc., Warrendale, Pa., announces that it has hired EDFAS member Dr. Lucille Giannuzzi as Regional Sales Manager for the Mid-Atlantic region because of her extensive experience in focused ion beam, scanning electron, and transmission electron microscopy, as well as her applications expertise in both the physical and life sciences.
Continue readingApplied Materials META Center to develop advanced semiconductor materials/processes
Applied Materials Inc., Santa Clara, Calif., announces plans for the Materials Engineering Technology Accelerator (META) Center, a major expansion of the company’s R&D capabilities aimed at creating new ways for Applied and its customers to drive innovation as classic Moore’s Law scaling becomes more challenging.
Continue readingSwiss Federal Labs join heat-sensitive materials with reactive foil nanolayers
Researchers at Swiss Federal Laboratories (EMPA) announce that they have developed a joining process in which reactive nano-multilayers join a wide variety of heat-sensitive components without any loss in quality.
Continue readingISTFA 2018 Conference summary and highlights
Two weeks ago, ASM Events coordinated the International Symposium for Testing and Failure Analysis (ISTFA) in Phoenix, co-located with the IEEE International Test Conference (ITC).
Continue readingPresto Engineering certifies semiconductor test facility in France to ISO quality standard
Presto Engineering, San Jose, Calif., reports that it has completed certification to the ISO 9001:2015 quality standard at its facility in Caen, France, which is Europe’s largest independent semiconductor test facility.
Continue readingGlobal semiconductor sales increase 14.9% year-to-year in August
The Semiconductor Industry Association (SIA), Washington, D.C., representing U.S. semiconductor manufacturing, design, and research, announces worldwide sales of semiconductors reached $40.16 billion for the month of August 2018, an increase of 14.9 percent compared to the August 2017 total of $34.96 billion.
Continue readingAES expands gas handling solutions with acquisition of Advanced Research Manufacturing
Applied Energy Systems (AES), Malvern, Pa., provider of high and ultra-high purity gas systems, services, and solutions – including design, manufacturing, testing, installation, and expert field services – announces the acquisition of Advanced Research Manufacturing (ARM) Inc., a specialty provider of gas purification systems based in Colorado Springs.
Continue readingWIN Semiconductors GaAs technology supports 5G equipment/network infrastructure
WIN Semiconductors Corp., Taiwan, reports the development and deployment of 5G user equipment and network infrastructure for the sub-6GHz and mmWave frequency bands.
Continue readingNew fabs invest over $220 billion; 2019 to mark all-time spending high
SEMI, Milpitas, Calif., has released the group’s World Fab Forecast, reporting that global fabricator equipment spending will increase by 14 percent this year to $62.8 billion, and is expected to rise 7.5 percent to $67.5 billion in 2019, marking the fourth consecutive year of spending growth and the highest investment year for fab equipment in the history of the industry.
Continue readingThermo Scientific Verios SEM extends sub-nanometer resolution over full energy range
Thermo Scientific, Waltham, Mass., has developed the Verios G4 scanning electron microscope, which has extended sub-nanometer resolution over the full 1 keV to 30 keV energy range to novel materials such as catalyst particles, nanotubes, porosities, interfaces, and other nanoscale structures.
Continue readingZinc oxide nanopillars deposited in surface coatings impale bacteria on nanospikes
The A-Star Institute of Bioengineering and Nanotechnology (IBN), Singapore, reports that its researchers have developed nanostructured coatings that annihilate microbes by piercing their cell walls.
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