Edax Inc., Mahwah, N.J., introduces a new series of Octane Elite silicon drift detectors, which offer up to 35% better light-element sensitivity and outstanding low-energy performance due to silicon nitride entry windows.

Hitachi High Technologies America Inc., Clarksburg, Md., announces that Hitachi, the University of Colorado at Boulder, and the TEM camera manufacturer Advanced Microscopy Techniques (AMT) of Woburn, Mass., have collaborated to develop a convenient software package for state-of-the-art, single or dual-axis tomography acquisition and extended image montaging for the Hitachi HT7700 TEM.

Rudolph Technologies Inc., Flanders, N.J., has purchased Stella Alliance LLC for its patented illumination, auto-focus, and image acquisition technology, which significantly enhances the ability to identify certain critical defects not visible with current techniques.

DCG Systems, Fremont, Calif., has released the Meridian M system for isolation of both routine and challenging electrical faults at the wafer level.

Georgia Institute of Technology, Atlanta, reports that its researchers have developed a technology for cooling transistors that is based on de-ionized water flowing through microfluidic passages.